Metodo No Destructivo Para Calcular Area Foliar

NOTES
H ORT S CIENCE 26(2):206. 1991.

A Rapid and Nondestructive Method for Estimating Leaf Area of Onions
S. Gamiely1, W.M. Randle2, H.A. Mills3, and D.A. Smittle3 Department of Horticulture,University of Georgia, Athens, GA 30602
Additional index words. growth, development, Allium cepa

The development of mathematical models from linear leaf measurements for predicting total leaf areahas been shown to be a useful tool in studying plant growth and development (Kvet and Marshall, 1971; Manivel and Weaver, 1974; Robbins and Pharr, 1987; Sepaskhah, 1977; Volkov and Selevtsev, 1959;Wiersma and Bailey, 1975). Simple, accurate models eliminate the need for expensive leaf area meters or time-consuming geometric reconstructions. Common measurements for prediction equations have beenleaf length, leaf width, petiole length, or some combination of these variables. Onion (Allium cepa L.) leaf and stem morphology differs from the morphology of plants used in previous leaf area models.Onion leaves develop from the upper surface of a broad, conical basal stem. Leaf blades are tubular and markedly flattened on the upper surface. As the onion plant grows, leaves will vary from longto short and thick to thin. Individual leaves will also vary in circumference from the leaf base to the leaf tip. Linear measurement(s) must, therefore, be representative of this variation to aid inthe development of an accurate leaf area model. The objective of this study was to develop and evaluate linear regression models that would accurately predict onion leaf area using nondestructive andsimple linear leaf measurements.
Received for publication 30 Jan. 1990. The cost of publishing this paper was defrayed in part by the payment of page charges. Under postal regulations, this papertherefore must be hereby marked advertisement solely to indicate this fact. 1 Graduate Student. 2 Assistant Professor of Horticulture. 3 Professor of Horticulture.

Thirty leaves were chosen at random...