Tecnico Electrnico
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type
(π-MOSⅦ)
TK5A50D
Switching Regulator Applications
•
•
•
•
Unit: mm
Low drain-source ON-resistance: RDS (ON) = 1.3 Ω (typ.)
High forward transfer admittance: ⎪Yfs⎪ = 3.0 S (typ.)
Low leakage current: IDSS = 10 μA (max) (VDS = 500 V)
Enhancement mode: Vth = 2.4 to 4.4 V (VDS = 10 V, ID = 1 mA)
AbsoluteMaximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Drain-source voltage
VDSS
500
V
Gate-source voltage
VGSS
±30
V
(Note 1)
ID
5
Pulse (t = 1 ms)
(Note 1)
IDP
20
Drain power dissipation (Tc = 25°C)
PD
35
W
Single pulse avalanche energy
(Note 2)
EAS
150
mJ
Avalanche current
IAR
5
A
Repetitive avalancheenergy (Note 3)
EAR
3.5
mJ
Channel temperature
Tch
150
°C
Storage temperature range
Tstg
−55 to 150
°C
DC
Drain current
A
1: Gate
2: Drain
3: Source
⎯
JEDEC
JEITA
SC-67
TOSHIBA
2-10U1B
Weight : 1.7 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significantchange in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/“Derating Concept and Methods’’) and individualreliability data (i.e.
reliability test report and estimated failure rate, etc).
Internal Connection
Thermal Characteristics
Characteristics
Symbol
Max
Unit
Thermal resistance, channel to case
Rth (ch-c)
3.57
°C/W
Thermal resistance, channel to ambient
Rth (ch-a)
62.5
°C/W
2
Note 1: Ensure that the channel temperature does not exceed 150°C.
1
Note 2:VDD = 90 V, Tch = 25°C (initial), L = 10.2 mH, RG = 25 Ω, IAR = 5 A
Note 3: Repetitive rating: pulse width limited by maximum channel temperature
This transistor is an electrostatic-sensitive device. Handle with care.
1
3
2010-06-03
TK5A50D
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage currentIGSS
VGS = ±30 V, VDS = 0 V
⎯
⎯
±1
μA
Drain cut-off current
IDSS
VDS = 500 V, VGS = 0 V
⎯
⎯
10
μA
V (BR) DSS
ID = 10 mA, VGS = 0 V
500
⎯
⎯
V
Vth
VDS = 10 V, ID = 1 mA
2.4
⎯
4.4
V
Drain-source ON-resistance
RDS (ON)
VGS = 10 V, ID = 2.5 A
⎯
1.3
1.5
Ω
Forward transfer admittance
⎪Yfs⎪
VDS = 10 V, ID =2.5 A
0.8
3.0
⎯
S
Input capacitance
Ciss
⎯
490
⎯
Reverse transfer capacitance
Crss
⎯
3
⎯
Output capacitance
Coss
⎯
55
⎯
⎯
18
⎯
⎯
40
⎯
Drain-source breakdown voltage
Gate threshold voltage
Rise time
VDS = 25 V, VGS = 0 V, f = 1 MHz
Turn-on time
ton
ns
⎯
8
⎯
⎯
55
⎯
⎯
11
⎯
⎯6
⎯
⎯
tf
Turn-off time
VOUT
RL = 80 Ω
50 Ω
Switching time
Fall time
ID = 2.5 A
10 V
VGS
0V
tr
5
⎯
VDD ≈ 200 V
toff
Duty ≤ 1%, tw = 10 μs
Total gate charge
Qg
Gate-source charge
Qgs
Gate-drain charge
Qgd
VDD ≈ 400 V, VGS = 10 V, ID = 5 A
pF
nC
Source-Drain Ratings and Characteristics (Ta = 25°C)
CharacteristicsSymbol
Test Condition
Min
Typ.
Max
Unit
Continuous drain reverse current (Note 1)
IDR
⎯
⎯
⎯
5
A
Pulse drain reverse current
IDRP
⎯
⎯
⎯
20
A
(Note 1)
Forward voltage (diode)
VDSF
IDR = 5 A, VGS = 0 V
⎯
⎯
−1.7
V
Reverse recovery time
trr
IDR = 5 A, VGS = 0 V,
⎯
1000
⎯
ns
Reverse recovery charge...
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