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IEEE Standard for Software and System Test Documentation

IEEE Computer Society
Sponsored by the Software & Systems Engineering Standards Committee

829

TM

IEEE 3 Park Avenue New York, NY 10016-5997, USA 18 July 2008

IEEE Std 829™-2008
(Revision of IEEE Std 829-1998)

Authorized licensed use limited to: University of New Brunswick. Downloaded on March 17,2010 at 18:30:15 EDT fromIEEE Xplore. Restrictions apply.

Authorized licensed use limited to: University of New Brunswick. Downloaded on March 17,2010 at 18:30:15 EDT from IEEE Xplore. Restrictions apply.

IEEE Std 829TM-2008
(Revision of IEEE Std 829-1998)

IEEE Standard for Software and System Test Documentation

Sponsor

Software & Systems Engineering Standards Committee of the IEEE Computer SocietyApproved 27 March 2008

IEEE-SA Standards Board

Authorized licensed use limited to: University of New Brunswick. Downloaded on March 17,2010 at 18:30:15 EDT from IEEE Xplore. Restrictions apply.

Abstract: Test processes determine whether the development products of a given activity conform to the requirements of that activity and whether the system and/or software satisfies its intendeduse and user needs. Testing process tasks are specified for different integrity levels. These process tasks determine the appropriate breadth and depth of test documentation. The documentation elements for each type of test documentation can then be selected. The scope of testing encompasses software-based systems, computer software, hardware, and their interfaces. This standard applies tosoftware-based systems being developed, maintained, or reused (legacy, commercial off-the-shelf, Non-Developmental Items). The term “software” also includes firmware, microcode, and documentation. Test processes can include inspection, analysis, demonstration, verification, and validation of software and software-based system products. Keywords: integrity level, life cycle, test documentation, testing

•The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 18 July 2008. Printed in the United States of America. IEEE is a registered trademarks in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and ElectronicsEngineers, Incorporated. PDF: Print: ISBN 978-0-7381-5746-7 ISBN 978-0-7381-5747-4 STD95799 STDPD95799

No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.

Authorized licensed use limited to: University of New Brunswick. Downloaded on March 17,2010 at 18:30:15 EDT from IEEE Xplore.Restrictions apply.

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